Effect of stress voltage on the dynamic buffer response of GaN-on-silicon transistors

被引:0
|
作者
机构
[1] Yacoub, H.
[2] Fahle, D.
[3] Eickelkamp, M.
[4] Wille, A.
[5] Mauder, C.
[6] Heuken, M.
[7] Kalisch, H.
[8] Vescan, A.
来源
| 1600年 / American Institute of Physics Inc.卷 / 119期
关键词
Gallium nitride;
D O I
暂无
中图分类号
学科分类号
摘要
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [1] Effect of stress voltage on the dynamic buffer response of GaN-on-silicon transistors
    Yacoub, H.
    Fahle, D.
    Eickelkamp, M.
    Wille, A.
    Mauder, C.
    Heuken, M.
    Kalisch, H.
    Vescan, A.
    JOURNAL OF APPLIED PHYSICS, 2016, 119 (13)
  • [2] Novel Oxide Buffer for Scalable GaN-on-Silicon
    Clark, A.
    Dargis, R.
    Arkun, F. E.
    Smith, R. S.
    GALLIUM NITRIDE AND SILICON CARBIDE POWER TECHNOLOGIES 4, 2014, 64 (07): : 163 - 170
  • [3] GaN-on-silicon high electron mobility transistors with blocking voltage of 3 kV
    Herbecq, N.
    Roch-Jeune, I.
    Linge, A.
    Grimbert, B.
    Zegaoui, M.
    Medjdoub, F.
    ELECTRONICS LETTERS, 2015, 51 (19) : 1532 - 1533
  • [4] High voltage GaN-on-silicon HEMT
    Boles, T.
    Varmazis, C.
    Carlson, D.
    Palacios, T.
    Turner, G. W.
    Molnar, R. J.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 5, 2013, 10 (05): : 844 - 848
  • [5] Low Buffer Trapping Effects above 1200 V in Normally off GaN-on-Silicon Field Effect Transistors
    Abid, Idriss
    Hamdaoui, Youssef
    Mehta, Jash
    Derluyn, Joff
    Medjdoub, Farid
    MICROMACHINES, 2022, 13 (09)
  • [6] Evidence for Temperature-Dependent Buffer-Induced Trapping in GaN-on-Silicon Power Transistors
    Meneghini, M.
    Silvestri, R.
    Dalcanale, S.
    Bisi, D.
    Zanoni, E.
    Meneghesso, G.
    Vanmeerbeek, P.
    Baneijee, A.
    Moens, P.
    2015 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2015,
  • [7] High Breakdown Voltage and Low Buffer Trapping in Superlattice GaN-on-Silicon Heterostructures for High Voltage Applications
    Tajalli, Alaleh
    Meneghini, Matteo
    Besendoerfer, Sven
    Kabouche, Riad
    Abid, Idriss
    Puesche, Roland
    Derluyn, Joff
    Degroote, Stefan
    Germain, Marianne
    Meissner, Elke
    Zanoni, Enrico
    Medjdoub, Farid
    Meneghesso, Gaudenzio
    MATERIALS, 2020, 13 (19)
  • [8] Effect of High Al Content AlGaN Buffer Layer on the Properties of GaN-on-Silicon Materials
    Liu, Yuqi
    Wang, Kai
    Nie, Zuorong
    Wang, Hong
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2024, 221 (02):
  • [9] GaN-on-silicon transistors with reduced current collapse and improved blocking voltage by means of local substrate removal
    Abid, Idriss
    Canato, Eleonora
    Meneghini, Matteo
    Meneghesso, Gaudenzio
    Cheng, Kai
    Medjdoub, Farid
    APPLIED PHYSICS EXPRESS, 2021, 14 (03)
  • [10] Above 2000 V breakdown voltage at 600 K GaN-on-silicon high electron mobility transistors
    Herbecq, Nicolas
    Roch-Jeune, Isabelle
    Linge, Astrid
    Zegaoui, Malek
    Jeannin, Pierre-Olivier
    Rouger, Nicolas
    Medjdoub, Farid
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2016, 213 (04): : 873 - 877