Quantifying the heat affected zone in laser scribing of thin film solar cells

被引：4
作者：
Bucher T. [1 ]
Brandal G. [2 ]
Chen H. [3 ]
Yao Y.L. [2 ]
机构：
[1] Advanced Manufacturing Laboratory, Department of Mechanical Engineering, Columbia University, 500 West 120th, Street, Room 220, New York, 10027, NY
[2] Advanced Manufacturing Laboratory, Department of Mechanical Engineering, Columbia University, New York, 10027, NY
[3] GE Global Research, Niskayuna, 12309, NY
来源：
Bucher, Tizian (tb2430@columbia.edu) | 1600年 / Elsevier Ltd卷 / 13期
基金：
美国国家科学基金会;
关键词：
Heat affected zone; Kelvin probe force microscopy; Laser scribing; Thin film solar cell;
D O I：
10.1016/j.mfglet.2017.05.002
中图分类号：
学科分类号：
摘要：
Laser scribing is a method for partitioning thin film solar panels into a series of mini-modules. While glass-side laser scribing is meant to be a thermally-induced mechanical material removal method, significant thermal damage may occur if the process is not properly designed. No approach has been developed yet to conveniently measure the size of the heat affected zone. Kelvin probe force microscopy was proposed and used to measure the heat affected zone via changes in the work function of the material. It was found that mechanically dominated material removal yields the smallest HAZ while also achieving a satisfactory electrical isolation. © 2017 Society of Manufacturing Engineers (SME)
引用
收藏
页码：11 / 14
页数：3
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