Hardness, electrical resistivity, and modeling of in situ Cu-Nb microcomposites

被引：0
作者：
Deng, Liping [1 ,2 ]
Han, Ke [2 ]
Hartwig, Karl T. [3 ]
Siegrist, Theo M. [2 ]
Dong, Lianyang [2 ]
Sun, Zeyuan [1 ]
Yang, Xiaofang [1 ]
Liu, Qing [1 ]
机构：
[1] [1,Deng, Liping
[2] Han, Ke
[3] Hartwig, Karl T.
[4] Siegrist, Theo M.
[5] Dong, Lianyang
[6] Sun, Zeyuan
[7] Yang, Xiaofang
[8] Liu, Qing
来源：
Han, K. (han@magnet.fsu.edu) | 1600年 / Elsevier Ltd卷 / 602期
关键词：
Hardness;
D O I：
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中图分类号：
学科分类号：
摘要：
Journal article (JA)
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收藏
页码：331 / 338
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