Approximate trace and singleton failures equivalences for event structures

被引：0

作者：

Li S.-R. ^{[1
]}

Wang C. ^{[2
]}

机构：

[1] School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu

[2] The 6th Research Institute of China Electronics Corporation, Haidian, Beijing

来源：

Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China | 2016年 / 45卷 / 04期

关键词：

Approximate equivalence; Event structures; Singleton failures; Step; Trace;

D O I：

10.3969/j.issn.1001-0548.2016.04.020

中图分类号：

学科分类号：

摘要：

Establishing system equivalences for event structures such as trace and testing equivalences, require the observed actions to be exactly identical. However, an accurate measurement is impossible when interacting with the physical world, hence exact equivalence is restrictive and not robust. Using Baire metric, this paper proposes a generalized framework of event structures approximation by developing the notions of approximate interleaving (trace and singleton failures) equivalence and approximate step (trace and singleton failures) equivalence. The proposed framework captures the traditional exact equivalence as a special case. These approximate equivalences satisfy the transitive property, consequently, they can be successively used in event structures approximations. © 2016, Editorial Board of Journal of the University of Electronic Science and Technology of China. All right reserved.

引用

页码：674 / 683

页数：9