Characteristics of epitaxial and implanted n-base 4H-SiC GTO thyristors

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作者
Fedison, J.B. [1 ]
Chow, T.P. [1 ]
机构
[1] Ctr. Intgd. Electronics E., Rensselaer Polytechnic Institute, 110 8th Street, Troy, NY 12180, United States
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D O I
10.4028/www.scientific.net/msf.353-356.739
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摘要
Silicon carbide
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页码:739 / 742
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