High-throughput and fast-speed Fourier ptychographic microscopy: A review

被引：0
|
作者：
Pan A. [1 ,2 ]
Yao B. [1 ,3 ]
机构：
[1] State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an
[2] University of Chinese Academy of Sciences, Beijing
[3] Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan
来源：
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2019年 / 48卷 / 06期
关键词：
Computational imaging; Fourier ptychographic microscopy; High throughput imaging; Phase retrieval;
D O I：
10.3788/IRLA201948.0603012
中图分类号：
学科分类号：
摘要：
Fourier ptychographic microscopy (FPM) is a promising label-free computational imaging technique with high resolution, wide field-of-view (FOV) and quantitative phase recovery. Due to its flexible setup, promising high-contrast performance without mechanical scanning and interferometric measurements, FPM has wide applications in the digital pathology, observation and dynamic imaging of label-free cells in vitro. In this review, the principle, research status and the latest advances were introduced in several aspects of FPM such as the system calibration methods, high-throughput imaging and high-speed imaging. The current problems and future trends were also presented. © 2019, Editorial Board of Journal of Infrared and Laser Engineering. All right reserved.
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