Investigation of SiGe/Si - heterostructures with high resolution X-ray diffraction methods

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[1] Frohberg, K.
[2] Wehner, B.
[3] Trui, B.
[4] Wolf, K.
[5] Paufler, P.
[6] Kück, H.
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Frohberg, K. | 2000年 / Trans Tech Publ, Uetikon-Zuerich, Switzerland卷 / 321期
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