Viscosity of entangled polystyrene thin film melts: Film thickness dependence

被引：74

作者：

Masson, Jean-Loup ^{[1
]}

Green, Peter F. ^{[1
]}

机构：

[1] Texas Materials Institute, Department of Chemical Engineering, University of Texas at Austin, Austin, TX 78712

来源：

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics | 2002年 / 65卷 / 03期

关键词：

Atomic force microscopy - Contact angle - Friction - Glass transition - Phase equilibria - Plastic films - Silicon - Spin coating - Vacuum - Van der Waals forces - Viscosity of liquids - Wetting;

D O I：

10.1103/PhysRevE.65.031806

中图分类号：

学科分类号：

摘要：

We determined the low-shear effective viscosity of entangled polystyrene thin film melts, in the thickness range of 21x/Si substrates. This was accomplished using a method based on the notion that thin liquid films can become unstable and rupture due to defects or to destabilizing, long-range van der Waals interactions (dewetting). The holes that are created in the film subsequently grow at a rate determined by a balance between the capillary driving forces and the viscous resistive forces. Based on the velocity of growth of holes on the substrate, we show that the viscosity decreases appreciably with decreasing thickness for 25 x/Si substrates exhibit an apparent decrease with decreasing film thickness over the same range of h. © 2002 The American Physical Society.

引用

页码：1 / 031806