In situ observation of etching profile in inductively coupled plasma etching of GaAs and InP using long distance microscope

被引:0
作者
Matsutani, Akihiro [1 ]
Ohtsuki, Hideo [2 ]
Koyama, Fumio [1 ]
机构
[1] Precision and Intelligence Lab., Tokyo Institute of Technology, Midori-ku, Yokohama 226-8503
[2] Samco International Inc., 36 Waraya-Cho, Takeda, Fujimi-ku
来源
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2003年 / 42卷 / 2 A期
关键词
Dry etching; GaAs; Inductively coupled plasma (ICP); InP; Long-distance microscope;
D O I
10.1143/jjap.42.426
中图分类号
学科分类号
摘要
We investigated the in situ observation of the etching profile in inductively coupled plasma etching of GaAs and InP, which enables real-time control of the etching profile and depth from outside the process chamber. The etching profile image of the line and space was obtained with a long-distance microscope. The image was almost the same as that obtained with a scanning electron microscope or a conventional optical microscope. We think that this proposed method is an important monitoring technique for real-time control in the dry etching process.
引用
收藏
页码:426 / 427
页数:1
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