Real-time simulation of power electronic devices

被引:0
|
作者
机构
[1] Ma, Xiaojun
[2] Yang, Zongmin
[3] Liu, Chunguang
[4] Zeng, Qinghan
来源
Yang, Z. (yzm024@139.com) | 1600年 / Automation of Electric Power Systems Press, P.O. Box 323, Nanjing, 210003, China卷 / 37期
关键词
Current spikes - Power electronic devices - Real time simulations - Switch loss - Voltage spikes;
D O I
10.7500/AEPS201210161
中图分类号
学科分类号
摘要
The voltage spike, current spike and power loss of power electronic devices in the switch process are important factors of reliability of power electronic devices and the power electronic system. The real-time simulation research on the power electronic device is studied using the basic switching cell of an insulated gate bipolar transistor (IGBT) as an example for its mature technique and popularity. A function model for power electronic device real-time simulation is developed according to the switching characteristics and current commutating process. The real-time simulation of power electronic devices is realized in the field programmable gate array (FPGA). The results are able to reflect the key indexes of voltage spike, current spike and power loss in the switching process. © 2013 State Grid Electric Power Research Institute Press.
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