Measurements of the nonlinear refractive index of free-standing porous silicon layers at different wavelengths

被引：7
|
作者：
机构：
来源：
| 2001年 / Taylor and Francis Inc.卷 / 81期
关键词：
D O I：
10.1080/13642810012470
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Free-standing porous silicon single and multiple optical cavities
    Ghulinyan, M
    Oton, CJ
    Bonetti, G
    Gaburro, Z
    Pavesi, L
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (12) : 9724 - 9729
  • [32] Anomalous birefringence of light in free-standing samples of porous silicon
    Kompan, ME
    Salonen, J
    Shabanov, IY
    JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS, 2000, 90 (02) : 324 - 329
  • [33] Anomalous birefringence of light in free-standing samples of porous silicon
    M. E. Kompan
    J. Salonen
    I. Yu. Shabanov
    Journal of Experimental and Theoretical Physics, 2000, 90 : 324 - 329
  • [34] Evidence of anisotropic structures of free-standing porous silicon films
    Technical Univ Chemnitz-Zwickau, Chemnitz, Germany
    Thin Solid Films, 1-2 (79-83):
  • [35] Evidence of anisotropic structures of free-standing porous silicon films
    Bruska, A
    Astrova, EV
    Falke, U
    Raschke, T
    Radehaus, C
    Hietschold, M
    THIN SOLID FILMS, 1997, 297 (1-2) : 79 - 83
  • [36] Conductivity of free-standing porous silicon layers using Terahertz differential time-domain spectroscopy
    Ramani, S.
    Cheville, Alan
    Garcia, J. Escorcia
    Agarwal, V.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 4 NO 6, 2007, 4 (06): : 2111 - +
  • [37] DETERMINATION OF THE COMPLEX REFRACTIVE INDEX OF POROUS SILICON LAYERS ON CRYSTALLINE SILICON SUBSTRATES
    Arenas, M. C.
    Hu, Hailin
    Nava, R.
    Del Rio, J. A.
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2010, 24 (24): : 4835 - 4850
  • [38] Preparation and characterization of free-standing porous silicon films with high porosity
    Xu, DS
    Guo, GL
    Gui, LL
    Zhang, BR
    Qin, GG
    ACTA PHYSICO-CHIMICA SINICA, 1998, 14 (07) : 577 - 580
  • [39] Optical absorption property of oxidized free-standing porous silicon films
    Xu, DS
    Guo, GL
    Gui, LL
    Tang, YQ
    Qin, GG
    PURE AND APPLIED CHEMISTRY, 2000, 72 (1-2) : 237 - 243
  • [40] Free-standing, mobile 3D porous silicon microstructures
    Lammel, G
    Renaud, P
    SENSORS AND ACTUATORS A-PHYSICAL, 2000, 85 (1-3) : 356 - 360
12345