Measurements of the nonlinear refractive index of free-standing porous silicon layers at different wavelengths

被引：7
|
作者：
机构：
来源：
| 2001年 / Taylor and Francis Inc.卷 / 81期
关键词：
D O I：
10.1080/13642810012470
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Measurements of the nonlinear refractive index of freestanding porous silicon layers at different wavelengths
    Lettieri, S
    Maddalena, P
    Odierna, LP
    Ninno, D
    La Ferrara, V
    Di Francia, G
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 2001, 81 (02): : 133 - 139
  • [2] Nonlinear optical refraction of free-standing porous silicon layers
    Lettieri, S.
    Fiore, O.
    Maddalena, P.
    Ninno, D.
    Di Francia, G.
    La Ferrara, V.
    Optics Communications, 1999, 168 (05): : 383 - 391
  • [3] Nonlinear optical refraction of free-standing porous silicon layers
    Lettieri, S
    Fiore, O
    Maddalena, P
    Ninno, D
    Di Francia, G
    La Ferrara, V
    OPTICS COMMUNICATIONS, 1999, 168 (5-6) : 383 - 391
  • [4] Free-Standing Luminescent Layers of Porous Silicon
    Goryachev, D. N.
    Belyakov, L. V.
    Sreseli, O. M.
    SEMICONDUCTORS, 2010, 44 (12) : 1588 - 1591
  • [5] Free-standing luminescent layers of porous silicon
    D. N. Goryachev
    L. V. Belyakov
    O. M. Sreseli
    Semiconductors, 2010, 44 : 1588 - 1591
  • [6] Determination of the complex refractive index of free-standing porous silicon and oxidized porous silicon in the Visible and Ultraviolet range
    Jimenez-Vivanco, Maria R.
    Lugo, Eduardo
    Torres-Costa, Vicente
    Martin-Palma, Raul J.
    Santana, Maricela
    Herrera, Raul
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2024, 130 (12):
  • [7] Electrical behavior of free-standing porous silicon layers
    Bazrafkan, I.
    Dariani, R. S.
    PHYSICA B-CONDENSED MATTER, 2009, 404 (12-13) : 1638 - 1642
  • [8] Transient voltage behavior of free-standing porous silicon layers
    Pennelli, G
    JOURNAL OF APPLIED PHYSICS, 1996, 80 (09) : 5116 - 5120
  • [9] The effect of deuterium on the optical properties of free-standing porous silicon layers
    Matsumoto, T
    Belogorokhov, AI
    Belogorokhova, LI
    Masumoto, Y
    Zhukov, EA
    NANOTECHNOLOGY, 2000, 11 (04) : 340 - 347
  • [10] Femtosecond nonlinear transmission study of free-standing porous silicon films
    Klimov, V
    McBranch, D
    Karavanskii, V
    SURFACE/INTERFACE AND STRESS EFFECTS IN ELECTRONIC MATERIALS NANOSTRUCTURES, 1996, 405 : 179 - 184
12345