An Optimization Placement Method for Circuit Breakers and Fault Current Limiters of Looped-type DC Micro-grids for Short Circuit Faults

被引：0

作者：

Nian H. ^{[1
]}

Kong L. ^{[1
]}

机构：

[1] College of Electrical Engineering, Zhejiang University, Hangzhou, 310027, Zhejiang

来源：

| 2018年 / Chinese Society for Electrical Engineering卷 / 38期

关键词：

DC circuit breaker; DC fault current limiter; Looped-type DC micro-grid; Non-dominated sorting genetic algorithm II (NSGS-II); Short-circuit fault;

D O I：

10.13334/j.0258-8013.pcsee.180681

中图分类号：

学科分类号：

摘要：

Short-circuit fault protection is a key to guarantee the safe and reliable operation of looped-type DC microgrids (DCMG). In DCMG, it is an effective fault protection strategy that the fault current limiter (FCL) limits short-circuit currents and the circuit breaker (CB) breaks the faulty line. The complex topology of looped-type DCMG and the strong coupling among branches increase the difficulty of optimizing CB and FCL in looped-type DCMG. In this paper, a simplified DCMG model under short-circuit faults was established, and analytical expressions of CB currents after faults occur was given. Then, a CB and FCL optimization configuration model was constructed, in which CB breaking capability and FCL inductance were used as optimization goals while short circuit breaking capacity of CB was used as constraint condition. The non-dominated sorting genetic algorithm-II (NSGA-II) was used to solve the optimization configuration problem of CB and FCL. Finally, comparing with NSGA, NSGA-II was used to solve an optimal configuration of CB and FCL in an 11-node DCMG model. The optimal result shows that the optimization method based on the improved NSGA-II for CB and FCL in looped-type DCMG can get an optimal configuration with both high reliability and low cost quickly. The proposed method has good applicability and can meet the requirement of DCMG operation. © 2018 Chin. Soc. for Elec. Eng.

引用

页码：6861 / 6872

页数：11

共 24 条

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