Detection of machine tool contouring errors using wavelet transforms and neural networks

被引：0
|
作者：
Fan, Chun [1 ]
Dong, Chensong [1 ]
Zhang, Chun [1 ]
Wang, H.P. [1 ]
机构：
[1] Dept. of Industrial Engineering, Florida A M Univ.-Florida Stt. Univ., Tallahassee, FL, United States
来源：
| 2001年 / Elsevier卷 / 20期
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