Surface analysis of al alloys with X-ray photoelectron and auger electron spectroscopies

被引：0
作者：
Sakairi, Masatoshi [1 ]
Sasaki, Ryo [2 ]
Suzuki, Keita [1 ]
机构：
[1] Faculty of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo
[2] Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo
来源：
Zairyo to Kankyo/ Corrosion Engineering | 2015年 / 64卷 / 07期
关键词：
AES; Aluminum; Metal cation; Passive film; XPS;
D O I：
10.3323/jcorr.64.281
中图分类号：
学科分类号：
摘要：
In this paper, X-ray photoelectron spectroscopy( XPS) and Auger electron spectroscopy( AES) were applied to investigate passive films formed on aluminum alloy in 0.5 kmol m-3 H3BO3/0.05 kmol m-3 Na2B4O7 with different metal cations. The metal cation is classified by metal cation hardness, X, which are calculated based on the concept of hard and soft acids and bases( HSAB) of the acid and base in Lewis's rule. From XPS analysis, the metal cations with X>4 were incorporated in passive films. The area-selected surface analysis of AES was also introduced.
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页码：281 / 284
页数：3
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