Radiation damage studies with STAR silicon drift detectors

被引：0

作者：

Takahashi, J. ^{[1
]}

Bellwied, R. ^{[1
]}

Beuttenmueller, R. ^{[1
]}

Chen, W. ^{[1
]}

Dezillie, B. ^{[1
]}

Eremin, V. ^{[1
]}

Elliot, D. ^{[1
]}

Hoffmann, G.W. ^{[1
]}

Huang, W. ^{[1
]}

Humanic, T. ^{[1
]}

Ilyashenko, I. ^{[1
]}

Kotov, I.V. ^{[1
]}

Kuczewski, P. ^{[1
]}

Leonhardt, W. ^{[1
]}

Li, Z. ^{[1
]}

et. al. ^{[1
]}

机构：

[1] Universidade de Sao Paulo, Sao Paulo, Brazil

来源：

| 2000年 / IEEE, Piscataway, NJ, United States卷 / 47期

关键词：

D O I：

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学科分类号：

摘要：

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