Energy-filtered electron interferometry in reflection electron microscopy

被引：0

作者：

Suzuki, T. ^{[1
]}

Tanishiro, Y. ^{[1
]}

Ishiguro, N. ^{[1
]}

Minoda, H. ^{[1
]}

Yagi, K. ^{[1
]}

机构：

[1] Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro, Tokyo 152-8551, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2001年 / 40卷 / 4 A期

关键词：

Coherent light - Electric potential - Electron diffraction - Electron energy loss spectroscopy - Holographic interferometry - Transmission electron microscopy - Vacuum applications - Wave filters - Wave plasma interactions;

D O I：

10.1143/jjap.40.2527

中图分类号：

学科分类号：

摘要：

We studied energy-filtered interferometry in reflection electron microscopy (REM) geometry for the first time. An ultra-high vacuum electron microscope (UHV-EM) equipped with a field emission gun (FEG), a Mollenstedt-type electron biprism and an omega-type energy-filter was used. The specimen was a well-defined Si(111) 7 × 7 clean surface. Single and multiple surface plasmon excitation is significant in a reflection electron energy loss spectrum (REELS) taken from the surface. The following was round in the REM geometry for the first rime. Visibility of carrier fringes in the interference region formed by no-plasmon-loss electrons is higher than that in an unfiltered one. The carrier fringes are also visible in the interferograms formed by electrons exciting the surface plasmon once or twice. The lateral coherent length of the electrons exciting the surface plasmon once is narrower (about 45 nm) than that of the no-plasmon-loss electrons (about 90 nm).

引用

页码：2527 / 2532