Pulwin: A program for analyzing powder x-ray diffraction patterns

被引：3
作者：
机构：
[1] Dipto. di Sci. e Tecnologie Chimiche, 1-33100 Udine
来源：
Brückner, S. (sergio.bruckner@dstc.uniud.it) | 2000年 / Cambridge University Press卷 / 15期
关键词：
D O I：
10.1017/S0885715600011118
中图分类号：
学科分类号：
摘要：
A computer program is presented that allows for the analysis of powder X-ray diffraction (XRD) patterns. Some peculiar features of the program are: the aptitude for dealing with diffractograms obtained from semicrystalline polymer samples and the ability to evaluate XRD patterns collected with CPS 120 detectors. The program is available as freeware via anonymous ftp at: ftp.cc.uniud.it under the directory/pulwin/. © 2000 International Centre for Diffraction Data.
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页码：218 / 219
页数：1
相关论文
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Bruckner S., J. Appl. Crystallogr., 33, pp. 977-979, (2000)
[2]  
Marquardt D.W., J. Soc. Ind. Appl. Math., 11, pp. 431-441, (1963)
[3]  
Press W.H., Teukolsky S.A., Vetterling W.T., Flannery B.P., Numerical Recipes in C, pp. 650-651, (1999)
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