Photoemission study on the 6H-SiC(0001) 3 × 3 surface

被引:0
作者
Ihm, Kyuwook [1 ]
Cho, Eun-Sang [2 ]
Hwang, Chan-Cuk [1 ]
Kang, Tai-Hee [1 ]
Jeon, Cheol-Ho [2 ]
Kim, Ki-Jeong [1 ]
Kim, Bongsoo [1 ]
Park, Chong-Yun [2 ]
机构
[1] Beamline Research Division, Pohang Accelerator Laboratory (PAL), Pohang Univ. of Sci. and Technology, Pohang
[2] Department of Physics, Institute of Basic Science, Sung Kyun Kwan University
来源
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2003年 / 42卷 / 5 A期
关键词
Alkali metals; Low-energy electron diffraction (LEED); Photoelectron spectroscopy; Secondary electron emission; Silicon carbide;
D O I
10.1143/jjap.42.2605
中图分类号
学科分类号
摘要
We have investigated the 6H-SiC(0001) √3 × √3 R30° and 3 × 3 surfaces using the valence band spectra and the workfunction change as a function of the Na coverage. The Na-induced ionization energy shift of the √3 × √3 R30° surface at the minimum value of the workfunction is in good agreement with the calculated one based on the Si-T4 model in which Na is adsorbed at all DBs. Similar workfunction changes suggest that the 6H-SiC(0001) 3 × 3 surface has the same density of reactive sites (1/3 ML) as the √3 × √3 R30° surface. This result is interpreted in the framework of current models of the 3 × 3 reconstruction. In particular, we show that the results are not compatible with the accepted Erlangen-Jena model.
引用
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页码:2605 / 2608
页数:3
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共 34 条
  • [1] Okumura H., Sakuma E., Lee J.H., Mukaida H., Misawa S., Endo K., Yoshida S., J. Appl. Phys., 61, (1987)
  • [2] Waldrop J.R., Grant R.W., Appl. Phys. Lett., 62, (1993)
  • [3] Nakanishi S., Tokutaka H., Nishimori K., Kishida S., Ishihara N., Appl. Surf. Sci., 41-42, (1989)
  • [4] Starke U., Bram C., Steiner P.-R., Hartner W., Hammer L., Heinz K., Muller K., Appl. Surf. Sci., 89, (1995)
  • [5] Nuehlhoff L., Choyke W.J., Bozack M.J., Yates J.T., J. Appl. Phys., 60, (1986)
  • [6] Kulakov M.A., Heuell P., Tsvetkov V.F., Bullemer B., Surf. Sci., 315, (1994)
  • [7] Chang C.S., Tong I.S.T., Wang Y.C., Davis R.F., Surf. Sci., 256, (1991)
  • [8] Shek M.L., Miyano, Dong Q.Y., Callott T.A., Ederer D.L., J. Vac. Sci. Technol. A, 12, (1994)
  • [9] Kakell P., Furthmuler J., Bechstedt F., Phys. Rev. B, 58, (1998)
  • [10] Kaplan R., Surf. Sci., 215, (1989)