Nanoscale thermal imaging of active devices by fluorescent SThM

被引：0
|
作者：
Lin, H.J. [1 ]
Assy, A. [1 ]
Lemaire, E. [2 ]
Briand, D. [2 ]
Billot, L. [1 ]
Gredin, P. [3 ]
Mortier, M. [3 ]
Chen, Z. [1 ]
Aigouy, L. [1 ]
机构：
[1] PSL Research University, LPEM, ESPCI, CNRS, UPMC, Sorbonne Universités, Paris,F-75005, France
[2] Institute of Microengineering, Ecole Polytechnique Fédérale de Lausanne, LMTS, Neuchâtel, Switzerland
[3] Chimie ParisTech, CNRS, IRCP, PSL Research University, Paris,75005, France
来源：
THERMINIC 2017 - 23rd International Workshop on Thermal Investigations of ICs and Systems | 2017年 / 2017-January卷
关键词：
Number:; 604668; Acronym:; EC; Sponsor: European Commission; -; NMP-2013-LARGE-7; FP7; Sponsor: Seventh Framework Programme;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Infrared imaging
引用
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页码：1 / 4
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