Influence of recrystallization on stability of tungsten scanning tunneling microscope tips

被引：0

作者：

Griffin, R. ^{[1
]}

Chandler, H. J. ^{[2
]}

Rubanov, S. ^{[3
]}

Schenk, A. K. ^{[1
]}

Pakes, C. I. ^{[1
]}

机构：

[1] La Trobe Univ, Sch Comp Engn & Math Sci, Dept Math & Phys Sci, Bundoora, Vic 3086, Australia

[2] Quantum Brilliance Pty Ltd, 60 Mills Rd, Acton, ACT 2601, Australia

[3] Univ Melbourne, Ian Holmes Imaging Ctr, Bio21 Inst, Parkville, Vic 3052, Australia

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2024年 / 95卷 / 10期

基金：

澳大利亚研究理事会;

关键词：

FIELD-EMISSION;

D O I：

10.1063/5.0196497

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The structure and electron emission properties of scanning tunneling microscope tips electrochemically etched from polycrystalline and recrystallized tungsten wires were investigated using scanning electron microscopy and transmission electron microscopy. Tips etched using the recrystallized wire had single crystal domains larger than those seen in tips etched from the cold drawn wire. The stability of the tips under high electric fields was investigated using field emission. It was found that tips etched from the recrystallized wire tended to have improved stability compared to those etched from the polycrystalline wire and that annealing either type of tip to high temperature in ultra-high vacuum had the greater influence on tip stability. (c) 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license

引用

页数：8

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