Materialpruefung/Materials Testing: Foreword

被引：0
|
作者：
Sonsino, C.M.
Zenner, H.
Portella, P.D.
机构：
来源：
Materialpruefung/Materials Testing | 2005年 / 47卷 / 05期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Bulletin of Materials Science: Foreword
    Krupanidhi, S.B.
    Bhat, H.L.
    Bulletin of Materials Science, 2009, 32 (03)
  • [22] Ferroelectric Materials and Their Applications FOREWORD
    Kakimoto, Ken-ichi
    Kuroiwa, Yoshihiro
    Cho, Yasuo
    Fujimura, Norifumi
    Fujisawa, Hironori
    Hoshina, Takuya
    Iwata, Makoto
    Kanno, Isaku
    Kato, Kazumi
    Kobayashi, Takeshi
    Nagata, Hajime
    Takeda, Hiroaki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2021, 60 (SF)
  • [23] Materials Science Forum: Foreword
    DECV, UA
    Mater Sci Forum, 2006, PART 1 (xi-xii):
  • [24] Ferroelectric Materials and Their Applications FOREWORD
    Fujimura, Norifumi
    Kuroiwa, Yoshihiro
    Ando, Akira
    Iwata, Makoto
    Kakimoto, Ken-ichi
    Kanno, Isaku
    Kato, Kazumi
    Kojima, Seiji
    Nagata, Hajime
    Shimizu, Masaru
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2019, 58 (SL)
  • [25] Electrochemistry of Electroactive Materials Foreword
    Hillman, A. Robert
    Pickup, Peter
    Seeber, Renato
    Skompska, Magdalena
    Vorotyntsev, Mikhail A.
    ELECTROCHIMICA ACTA, 2014, 122 : 1 - 2
  • [26] Materials Science Forum: Foreword
    Filho, Francisco Ambrozio
    Salgado, Lucio
    Materials Science Forum, 2008, 591-593
  • [27] Smart materials and structures: Foreword
    Bhattacharyya, Abhijit
    Lagoudas, Dimitris C.
    2007, Institute of Physics Publishing, Bristol, United Kingdom (16)
  • [28] Journal of Electronic Materials: Foreword
    Phillips, Jamie
    Stahlbush, Robert
    Xing, Grace
    2008, Springer New York LLC, New York, 10013-1578, United States (37)
  • [29] Inorganic molecular materials Foreword
    Andruh, Marius
    COMPTES RENDUS CHIMIE, 2012, 15 (10) : 837 - 837
  • [30] Journal of Electronic Materials: Foreword
    GM RandD Center, Warren, MI, United States
    J Electron Mater, 2007, 7 (703):
12345