Study on lower-frequency voltage noise of moving vortex lattice in type-II superconductors

被引:0
作者
Zhao, Zhi-Gang [1 ]
He, Guo-Liang [1 ]
Wang, Yong-Gang [1 ]
Liu, Mei [1 ]
机构
[1] Dept. of Physics, Southeast Univ., Nanjing 210096, China
来源
Wuli Xuebao/Acta Physica Sinica | 2004年 / 53卷 / 08期
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摘要
10
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页码:2751 / 2754
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[41]   Theory of the square to rhomb structural phase transitions in the vortex lattice of type-II superconductors [J].
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[42]   CORRELATION BETWEEN VORTEX LATTICE AND CRYSTAL-LATTICE IN TYPE-II SUPERCONDUCTORS DUE TO ELASTIC INTERACTION [J].
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