共 30 条
- [1] Meeker W Q, Escobar L A., Statistical methods for reliability data, pp. 11-14, (1998)
- [2] Nelson W B., Accelerated testing: Statistical models, test plans and data analyses, pp. 254-266, (1990)
- [3] Huang W, Dietrich D L., An alternative degradation reliability modeling approach using maximum likelihood estimation, ⅠEEE Transactions on Reliability, 54, 2, pp. 310-317, (2005)
- [4] Meeker W Q, LuValle M J., An accelerated life test model based on reliability kinetics, Technometrics, 37, 2, pp. 133-146, (1995)
- [5] Cui Z, Liou J J, Yue Y., A new extrapolation method for long-term degradation prediction of deep-submicron MOSFETs, ⅠEEE Transactions on Electron Devices, 50, 5, pp. 1398-1401, (2003)
- [6] Ye Z S, Xie M., Stochastic modelling and analysis of degradation for highly reliable products, Applied Stochastic Models in Business and Ⅰndustry, 31, 1, pp. 16-32, (2015)
- [7] Gan J, Shu T, Shi H, Et al., Ⅰntegrated modeling of stand-alone scheduling and predictive maintenance under heterogeneous loads, Control and Decision, 39, 3, pp. 1003-1011, (2024)
- [8] Zheng L, Du Y H, Xing L N, Et al., Product reliability modeling and analysis using degradation and marker data, Control and Decision, 35, 2, pp. 461-468, (2020)
- [9] Zhang X H, Tao Q Q, Yang T X, Et al., Optimal switching and condition-based maintenance decision of cold/warm mixed stanby system, Control and Decision, 39, 6, pp. 2069-2078, (2024)
- [10] Wang X, Xu D H., An inverse Gaussian process model for degradation data, Technometrics, 52, 2, pp. 188-197, (2010)