Characterization of organic/metal interfaces using angle-resolved X-ray photoelectron spectroscopy

被引：0
|
作者：
Ito, Eisuke [1 ]
Hara, Masahiko [1 ,2 ]
机构：
[1] Local Spatio-Temporal Functions Laboratory, Frontier Research System, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
[2] Department of Electronic Chemistry, Interdisciplinary School of Engineering, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8502, Japan
来源：
Japanese Journal of Applied Physics | 2008年 / 47卷 / 2 PART 2期
关键词：
23;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
页码：1393 / 1396
相关论文
共 50 条
  • [41] Computer simulation of angle-resolved x-ray photoelectron spectroscopy measurements for the study of surface and interface roughnesses
    Oswald, S.
    Oswald, F.
    Journal of Applied Physics, 2006, 100 (10):
  • [42] Depth-resolved composition and chemistry of ultra-thin films by angle-resolved x-ray photoelectron spectroscopy
    Brundle, CR
    Conti, G
    Graoui, H
    Foad, M
    Hung, S
    Wang, C
    Uritsky, YS
    Mack, P
    Wolstenholme, J
    Characterization and Metrology for ULSI Technology 2005, 2005, 788 : 307 - 313
  • [43] Angle-resolved x-ray photoelectron spectroscopy comparison of copper/Teflon AF1600 and aluminum/Kapton metal diffusion
    Popovici, D
    Piyakis, K
    Meunier, M
    Sacher, E
    JOURNAL OF APPLIED PHYSICS, 1998, 83 (01) : 108 - 111
  • [44] Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data
    Powell, C. J.
    Werner, W. S. M.
    Smekal, W.
    SURFACE AND INTERFACE ANALYSIS, 2011, 43 (07) : 1046 - 1056
  • [45] Highly angle-resolved x-ray photoelectron diffraction from solid surfaces
    Tamura, K
    Shiraki, S
    Ishii, H
    Owari, M
    Nihei, Y
    SURFACE REVIEW AND LETTERS, 2003, 10 (2-3) : 257 - 261
  • [46] The complementary nature of x-ray photoelectron spectroscopy and angle-resolved x-ray diffraction - Part II: Analysis of oxides on dental alloys
    Kerber, SJ
    Barr, TL
    Mann, GP
    Brantley, WA
    Papazoglou, E
    Mitchell, JC
    JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE, 1998, 7 (03) : 334 - 342
  • [47] ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY AS A NONINVASIVE CHARACTERIZATION TECHNIQUE FOR THE SURFACE REGION OF PROCESSED (HG, CD)TE
    SEELMANNEGGEBERT, M
    RICHTER, HJ
    ZIEGLER, J
    FUTURE INFRARED DETECTOR MATERIALS, 1989, 1106 : 181 - 189
  • [48] The complementary nature of x-ray photoelectron spectroscopy and angle-resolved x-ray diffraction part II: Analysis of oxides on dental alloys
    S. J. Kerber
    T. L. Barr
    G. P. Mann
    W. A. Brantley
    E. Papazoglou
    J. C. Mitchell
    Journal of Materials Engineering and Performance, 1998, 7 : 334 - 342
  • [49] ANGLE-RESOLVED X-RAY-PHOTOELECTRON SPECTROSCOPY OF HIGHLY ORIENTED PYROLITIC GRAPHITE
    HOFFMAN, A
    NYBERG, GL
    LIESEGANG, J
    PHYSICAL REVIEW B, 1992, 45 (10): : 5679 - 5682
  • [50] Attosecond angle-resolved photoelectron spectroscopy
    Aseyev, SA
    Ni, Y
    Frasinski, LJ
    Muller, HG
    Vrakking, MJJ
    PHYSICAL REVIEW LETTERS, 2003, 91 (22)
12345