Possible flaw in atomic force microscope

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Civil Engineers Australia | 2003年 / 75卷 / 05期
关键词：
Calibration - Defects - Image quality - Instrument components - Microscopes - Standards;
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摘要：
A design flaw in a key component of the atomic force microscope (AFM) was discovered. Mechanical principles were used to prove that the popular V-shaped cantilever used in the AFM degrades the performance of the instrument. Calculations established that the simple cantilever design of a straight beam proposed for the original AFM offered improved performance over the V-shape while facilitating calibration and measurement interpretation.
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页码：52 / 53
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