Radiation defects in lithium-doped silicon grown by the Czochralski technique

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作者：
Bogatov, N.M. [1 ]
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[1] Kuban' State Univ, Krasnodar, Russia
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Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2000年 / 15卷 / 08期
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页码：1247 / 1253
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