Core dependence of electron emission in slow collisions of highly charged ions (Ar16+, Kr16+, Xe16+) with C60

被引：0

作者：

Bernard, J. ^{[1
]}

Brédy, R. ^{[1
]}

Martin, S. ^{[1
]}

Chen, L. ^{[1
]}

Désesquelles, J. ^{[1
]}

Buchet-Poulizac, M.C. ^{[1
]}

机构：

[1] UMR CNRS 5579, Campus de la Doua, Université Lyon 1, F-69622 Villeurbanne Cedex, France

来源：

Physical Review A - Atomic, Molecular, and Optical Physics | 2002年 / 66卷 / 01期

关键词：

Argon - Electric charge - Electron energy analyzers - Electron energy levels - Electron spectroscopy - Fullerenes - Ion beams - Ionization - Krypton - Positive ions - Xenon;

D O I：

暂无

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学科分类号：

摘要：

An isocharge study of multielectronic capture and stabilization in slow collisions of Ar16+, Kr16+and Xe16+with C60, was performed. A collision channel, corresponding to s electrons stabilized on the projectile from r active electrons, was associated with the partial cross section, σrs. The study showed that the core dependence of electron emission in the collisions had an effect when the number of transferred electrons was sufficiently high.

引用

页码：132091 / 132097