Investigation on nanoscale processes on the BaF2(111) surface in various solutions by frequency modulation atomic force microscopy

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[1] Kobayashi, Naritaka
[2] Kawamura, Ryuzo
[3] 1,Yoshikawa, Hiroshi Y.
[4] 1,Nakabayashi, Seiichiro
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| 1600年 / American Institute of Physics Inc.卷 / 119期
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Atomic force microscopy;
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