Statistical resolution analysis of microwave computational imaging

被引：0

作者：

Zhang, Jinyu ^{[1
]}

Hu, Taiyang ^{[1
]}

Xiao, Mengxuan ^{[1
]}

Zhang, Haoxuan ^{[1
]}

Wu, Li ^{[1
]}

Xiao, Zelong ^{[1
]}

机构：

[1] Nanjing Univ Sci & Technol, Nanjing, Peoples R China

来源：

ELECTRONICS LETTERS | 2024年 / 60卷 / 21期

关键词：

microwave imaging; millimetre wave imaging; sensors; MODEL;

D O I：

10.1049/ell2.70078

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter presents a model based on the Cram & eacute;r-Rao bound theory for calculating the theoretical lower limit of imaging resolution of microwave computational imaging aided by re-configurable metasurface. The model takes into account two crucial parameters: the signal-to-noise ratio and the number of measurements in the imaging process. By simultaneously considering the signal-to-noise ratio and the number of measurements, as well as other parameters, the model allows for a comprehensive assessment of the imaging resolution of the imaging system. In addition, both position estimation and intensity estimation are considered, and a new composite statistical resolution concept is proposed, which is more suitable for microwave computational imaging.

引用

页数：4

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