Investigation of bonding in nano-SiO2 by Si L2,3 X-ray absorption near-edge structure spectroscopy

被引：0

作者：

Wu, Z.Y. ^{[1
]}

Ibrahim, K. ^{[1
]}

Li, G. ^{[1
]}

Zhang, J. ^{[1
]}

Liu, F.Q. ^{[1
]}

Abbas, M.I. ^{[1
]}

Hu, R. ^{[1
]}

Qian, H.J. ^{[1
]}

Tang, F.Q. ^{[1
]}

机构：

[1] Inst. of High Energy Phys., Chinese Acad. of Sci., Beijing 100039, China

来源：

Acta Metallurgica Sinica (English Letters) | 2001年 / 14卷 / 06期

关键词：

Absorption - Bonding - Silica - Silicon - Spectroscopy - X rays;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The Si L2,3 X-ray absorption near-edge structure (XANES) can be used to probe the local structure around Si and derive electronic information of the unoccupied s- and d-like partial density of states in nano-size SiO2. We present Si L2,3-edge for three different size silicates acquired by total electron yield (TEY) at the photoemission station of Beijing Synchrotron Radiation Facility (BSRF). The Si L2,3-edge spectra are interpreted based on ab initio full multiple-scattering (MS) calculation. The Si L2,3-edge of nano-size materials has XANES similar to that of α-quartz. The similarities between the Si L2,3-edge shapes attest to a common molecular-orbital picture of their Si-O bonding and the same coordination state. However, a considerable broadening of Si L2,3-edge XANES spectra as decrease of particle size is also an indicative of polyhedral distortions.

引用

页码：473 / 478