Influence of tip wear on atomic force acoustic microscopy experiments

被引：0
|
作者：
Kopycinska-Müler, Mulgorzata [1 ]
Geiss, Roy H. [1 ]
Rice, Paul [1 ]
Hurley, Donna C. [1 ]
机构：
[1] Materials Reliability Division, National Institute of Standards and Technology, Boulder, CO 80303-3328, United States
来源：
Mater Res Soc Symp Proc | 1600年 / 146-151期
关键词：
Compendex;
D O I：
2004 MRS Fall Meeting
中图分类号：
学科分类号：
摘要：
Acoustic variables measurement - Atomic force microscopy - Elastic constants - Mathematical models - Scanning electron microscopy
引用
收藏
相关论文
共 50 条
  • [1] Wear of the atomic force microscope tip under light load, studied by atomic force microscopy
    Laboratory of Tribology, Faculty of Engineering, Tohoku University, Sendai 980-77, Japan
    ULTRAMICROSCOPY, 1 (11-16):
  • [2] Studies of tip wear processes in tapping mode™ atomic force microscopy
    Su, CM
    Huang, L
    Kjoller, K
    Babcock, K
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 135 - 144
  • [3] Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
    Killgore, Jason P.
    Geiss, Roy H.
    Hurley, Donna C.
    SMALL, 2011, 7 (08) : 1018 - 1022
  • [4] WEAR OF THE ATOMIC-FORCE MICROSCOPE TIP UNDER LIGHT LOAD, STUDIED BY ATOMIC-FORCE MICROSCOPY
    KHURSHUDOV, A
    KATO, K
    ULTRAMICROSCOPY, 1995, 60 (01) : 11 - 16
  • [5] Tip characterizer for atomic force microscopy
    Itoh, Hiroshi
    Fujimoto, Toshiyuki
    Ichimura, Shingo
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (10):
  • [6] Influence of tip geometry on fractal analysis of atomic force microscopy images
    A. Mannelquist
    N. Almqvist
    S. Fredriksson
    Applied Physics A, 1998, 66 : S891 - S895
  • [7] Influence of tip geometry on fractal analysis of atomic force microscopy images
    Mannelquist, A
    Almqvist, N
    Fredriksson, S
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S891 - S895
  • [8] Effects of system parameters on tip-wear in tapping mode atomic force microscopy
    Huang, Yen-Pu
    Lin, Shih-Chieh
    Lin, Victor Tzeng-Yow
    SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES, 2013, 1 (01):
  • [9] ACOUSTIC MICROSCOPY BY ATOMIC-FORCE MICROSCOPY
    RABE, U
    ARNOLD, W
    APPLIED PHYSICS LETTERS, 1994, 64 (12) : 1493 - 1495
  • [10] ATOMIC FORCE MICROSCOPY A tip for diagnosing cancer
    Lekka, Malgorzata
    NATURE NANOTECHNOLOGY, 2012, 7 (11) : 691 - 692
12345