Design of High-Speed Data Acquisition System for Fast Line-Scan Spectrometry

被引：0

作者：

Shui, Xuqing ^{[1
]}

Wang, Zizheng ^{[2
]}

Bai, Chengpei ^{[1
]}

Hu, Chunguang ^{[2
]}

机构：

[1] Tianjin Univ, Engn, Tianjin, Peoples R China

[2] Tianjin Univ, Sch Precis Instruments & Optoelect Engn, Tianjin, Peoples R China

来源：

IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 2024年 / 27卷 / 08期

基金：

中国国家自然科学基金;

关键词：

Spectroscopy; Runtime; System performance; Data acquisition; Prototypes; Universal Serial Bus; Delays; Velocity measurement; Monitoring; Clocks; THICKNESS;

D O I：

10.1109/MIM.2024.10743130

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The data acquisition system (DAS) is an indispensable part of line-scan spectrometry (LSS), dominating system performance, especially the sampling rate. In response to the demand for high-speed in-situ LSS monitoring, this paper presents a DAS design capable of fast spectra sampling. The system data flow and timing relationships are analyzed, and a special design strategy is proposed. By adopting this strategy, we determine the key parameters like clock frequency and system delay and develop the corresponding DAS prototype. Experiments verify that the prototype device can achieve a high sampling rate of 4 k frames/s and its error-free runtime beyond 16 hours, qualifying it to be applied for monitoring the high dynamic machining process, which proves the effectiveness of our analysis and design strategy.

引用

页码：16 / 22

页数：7

共 10 条

[1]

[Anonymous], 2024, HAMAMATSU PHOTONICS

[2]

Huang L., 2019, Compact data acquisition system for micro spectrometer, P156

[3] Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers [J].