共 50 条
- [41] Hard X-ray microtomography using X-ray imaging optics 1600, Japan Society of Applied Physics (40): : 1499 - 1503
- [42] Characterization of roughness correlations in W/Si multilayers by diffuse x-ray scattering Salditt, T., 1600, Editions de Physique, Les Ulis (04):
- [43] Boundary structure of Mo/Si multilayers for soft X-ray mirrors Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2002, 41 (5 A): : 3052 - 3056
- [44] Boundary structure of Mo/Si multilayers for soft X-ray mirrors JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (5A): : 3052 - 3056
- [45] An approach to the theory of X-ray multilayers with graded period NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 448 (1-2): : 142 - 146
- [46] INDUSTRIAL MANUFACTURING OF MULTILAYERS MIRRORS FOR X-RAY OPTICS X-RAY INSTRUMENTATION IN MEDICINE AND BIOLOGY, PLASMA PHYSICS, ASTROPHYSICS, AND SYNCHROTRON RADIATION, 1989, 1140 : 560 - 565
- [47] Calibration of HEFT hard X-ray optics PROCEEDINGS OF THE X-RAY UNIVERSE 2005, VOLS 1 AND 2, 2006, 604 : 955 - +
- [48] Multilayer optics for hard X-ray astronomy X-RAY OPTICS, INSTRUMENTS, AND MISSIONS IV, 2000, 4138 : 120 - 125