Designs and analysis of series capacitive RF-MEMS switches

被引:0
|
作者
机构
[1] Sun, Jianhai
[2] Cui, Dafu
来源
Sun, J. (jhsun2008@yahoo.com.cn) | 2005年 / Science Press卷 / 26期
关键词
6;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Scalability of capacitive RF MEMS switches
    Ulm, M
    Reimann, M
    Walter, T
    Müller-Fiedler, R
    Kasper, E
    TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2001, : 1536 - 1538
  • [42] Polyimide planarization for RF-MEMS switches on PCB
    Ghodsian, B
    Jung, C
    Cetiner, BA
    De Flaviis, F
    PROCEEDINGS OF THE IEEE SENSORS 2004, VOLS 1-3, 2004, : 605 - 606
  • [43] RF actuation of capacitive MEMS switches
    Reid, JR
    Starman, LA
    Webster, RT
    2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2003, : 1919 - 1922
  • [44] Acceleration of Microwelding on Ohmic RF-MEMS Switches
    Tazzoli, Augusto
    Meneghesso, Gaudenzio
    JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2011, 20 (03) : 552 - 554
  • [45] RF-MEMS switches for reconfigurable integrated circuits
    Brown, ER
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1998, 46 (11) : 1868 - 1880
  • [46] Thermal cycling reliability of RF-MEMS switches
    Mulloni, V.
    Sordo, G.
    Margesin, B.
    SMART SENSORS, ACTUATORS, AND MEMS VII; AND CYBER PHYSICAL SYSTEMS, 2015, 9517
  • [47] Reliability Research of Capacitive RF-MEMS Switch
    Song, Mingxin
    Wu, Rui
    Liu, Qian
    Wang, Hong
    Gao, Zuobao
    Chen, Minghua
    Yin, Jinghua
    MATERIALS PROCESSING AND MANUFACTURING III, PTS 1-4, 2013, 753-755 : 2507 - 2510
  • [48] RF-MEMS switches: Paradigms of microwave switching
    Mollah, MN
    Karmakar, NC
    APMC 2001: ASIA-PACIFIC MICROWAVE CONFERENCE, VOLS 1-3, PROCEEDINGS, 2001, : 1024 - 1027
  • [49] Piezoelectric actuation for application in RF-MEMS switches
    Klaasse, G
    Puers, B
    Tilmans, HAC
    MEMS, MOEMS, AND MICROMACHINING, 2004, 5455 : 174 - 180
  • [50] Failure predictive model of capacitive RF-MEMS
    Mellé, S
    De Conto, D
    Mazenq, L
    Dubuc, D
    Poussard, B
    Bordas, C
    Grenier, K
    Bary, L
    Vendier, O
    Muraro, JL
    Cazaux, JL
    Plana, R
    MICROELECTRONICS RELIABILITY, 2005, 45 (9-11) : 1770 - 1775