An in situ transmission electron microscope investigation into grain growth and ordering of sputter-deposited nanocrystalline Ni3Al thin films

被引：0

作者：

Ng, H.P. ^{[1
]}

Ngan, A.H.W. ^{[1
]}

机构：

[1] Lab. des Mat. et du Genie Physique, ENSPG-INPG UM 5628, BP 46, 38402, St. Martin d'Heres, France

来源：

| 2002年 / Materials Research Society卷 / 17期

关键词：

Arrhenius rate law - Grain coalescence - Isothermal heating - Nickel aluminide;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

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