Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

被引：0
|
作者：
Abboud, A. [1 ]
Kirchlechner, C. [2 ,3 ]
Keckes, J. [3 ]
Nurdan, T. Conka [4 ]
Send, S. [1 ]
Micha, J.S. [5 ]
Ulrich, O. [5 ]
Hartmann, R. [6 ]
Strüder, L. [1 ,6 ]
Pietsch, U. [1 ]
机构：
[1] Department of Physics, University of Siegen, Siegen,57072, Germany
[2] Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf,40237, Germany
[3] Montanuniversität Leoben, Leoben,8700, Austria
[4] Fakultät für Ingenieurwissenschaften, Türkish German Universität, Sahinkaya Caddesi 86, Istanbul,34820, Turkey
[5] CEA-Grenoble/DRFMC/SprAM, 17 rue des Martyrs, Grenoble Cedex 9,F-38054, France
[6] PNSensor GmbH, Otto-Hahn-Ring 6, München,81739, Germany
来源：
Journal of Applied Crystallography | 2017年 / 50卷
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学科分类号：
摘要：
31
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页码：901 / 908
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