Excitation of the 3p4(4s,3d,4p) Ar+states during Ar photoionization: Intensity, alignment, and orientation

被引：0

作者：

Van der Hart, Hugo W. ^{[1
]}

Greene, Chris H. ^{[1
]}

机构：

[1] Dept. of Applied Math./Theor. Phys., Queen's University Belfast, Belfast BT7 1NN, United Kingdom

来源：

Physical Review A - Atomic, Molecular, and Optical Physics | 2002年 / 65卷 / 6 A期

关键词：

Approximation theory - Electronic structure - Fluorescence - Hamiltonians - Light polarization - Optimization - Perturbation techniques - Photoemission - Photoionization - Photons - Probability;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Photoionization cross sections for Ar were obtained including the probability for exciting the residual Ar+ion to the lowest 3s23p4nl states. It was found that the photon energy range from 30 to 38 eV, 17 doublet 3s2304nl states of Ar+can be excited. The results showed that atomic structure had a huge influence on the photoionization with excitation cross sections.

引用

页码：625091 / 625091