Calibration of magnetic force microscopy using micron size straight current wires

被引：0

作者：

Liu, Congxiao ^{[1
]}

Lin, Kingston ^{[1
]}

Holmes, Rich ^{[1
]}

Mankey, Gary J. ^{[2
]}

Fujiwara, Hideo ^{[2
]}

Jiang, Huaming ^{[2
]}

Seok Cho, Hae ^{[3
]}

机构：

[1] Read-Rite Corporation, 345 Los Coches Street, Milpitas, CA 95035, United States

[2] Center for Materials for Information Technology, Department of Physics, University of Alabama, Tuscaloosa, AL 35487, United States

[3] Seagate Technology, 7801 Computer Avenue South, Minneapolis, MN 55435, United States

来源：

| 1600年 / American Institute of Physics Inc.卷 / 91期

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