Comparative performance assessment of beam hardening correction algorithms applied on simulated data sets

被引：0

作者：

Cao, W. ^{[1
,2
]}

Sun, T. ^{[3
]}

Fardell, G. ^{[1
]}

Price, B. ^{[1
]}

Dewulf, W. ^{[2
]}

机构：

[1] X-Tek Systems Ltd (Nikon Metrology UK Ltd), Unit 5, Icknield Industrial Estate, Tring, United Kingdom

[2] Department of Mechanical Engineering, KU Leuven, Celestijnenlaan 300, Leuven,3001, Belgium

[3] Department of Nuclear Medicine & Molecular Imaging, KU Leuven, UZ Herestraat 49, Leuven,3000, Belgium

来源：

Journal of Microscopy | 2018年 / 272卷 / 03期

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页码：229 / 241