Reliability of photovoltaic modules based on climatic measurement data

被引：2

作者：

Laronde R. ^{[1
]}

Charki A. ^{[1
]}

Bigaud D. ^{[1
]}

机构：

[1] University of Angers, LASQUO Laboratory

来源：

International Journal of Metrology and Quality Engineering | 2010年 / 1卷 / 01期

关键词：

Accelerated life testing; Life-time; Malfunctioning; Photovoltaic module; Reliability law; Stochastic;

D O I：

10.1051/ijmqe/2010012

中图分类号：

学科分类号：

摘要：

In the building domain, components or equipment are often subjected to severe environmental conditions. In order to predict the reliability and the life-time of such equipment, accelerated life testing can be carried out. Severe conditions are applied to accelerate the ageing of the components and the reliability at nominal conditions is then deduced considering that these nominal conditions are not constant but stochastic. In this paper, the accelerated life testing of photovoltaic modules is carried out at severe module temperature levels. The module power losses are monitored and the limit state is determined when a threshold power is reached. The stochastic data and the reliability are simulated during a period of twenty years. Finally, the life time of the component is evaluated. © EDP Sciences 2010.

引用

页码：45 / 49

页数：4

共 11 条

[1]

Tsuda I., Igari S., Nakahara K., Takahisa K., Morita K., Kato H., Long term reliability evaluation of PV module, 3rd World Conference on Photovoltaic Energy Conversion, pp. 1960-1963, (2003)

[2]

Vazquez M., Rey-Stolle I., Prog. Photovolt. Res. Appl., 16, (2008)

[3]

Wohlgemuth J.H., Cunningham D.W., Nguyen M., Miller J., Long term reliability of PV modules, 20th European Photovoltaic Solar Energy Conference, pp. 1942-1946, (2005)

[4]

Voiculescu S., Guerin F., Barreau M., Charki A., Todoskoff A., Reliability estimation in random environment: Different approaches, RAMS 2007, pp. 202-207, (2007)

[5]

Nelson W.B., Accelerated Testing: Statistical Models, Test Plans and Data Analyses, (1990)

[6]

Guerin F., Lantieri P., Dumon B., Applying accelerated life models to halt testing, 9th ISSAT International Conference on Reliability and Quality Design, (2003)

[7]

Voiculescu S., Guerin F., Barreau M., Charki A., Int. J. Product Development, 7, (2009)

[8]

Kenny R.P., Dunlop E.D., Ossenbrink H.A., Mullejans H., Prog. Photovolt. Res. Appl., 14, (2006)

[9]

Crystalline Silicon Terrestrial Photovoltaic (PV) Modules-Design Qualification and Type Approval, (2005)

[10]

Analytical Expression for Daily Solar Profiles, (1997)

← 1 2 →