A method of testing the surface resistance of diffusion conductor structures

被引：0

作者：

Sviderskaya, L.I. ^{[1
]}

机构：

[1] Kharkov National University of Radio Engineering and Electronics, 14, Lenin Ave, Kharkov, 61166, Ukraine

来源：

Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika) | 2002年 / 57卷 / 04期

关键词：

Coupled circuits - Diffusion - Electric resistance - Q factor measurement - Resonators;

D O I：

10.1615/telecomradeng.v57.i4.120

中图分类号：

学科分类号：

摘要：

A possibility to determine the surface diffusion structure resistance using a MW-resonator technique has been analyzed. The theoretically derived relations indicate that for the particular value of σinit the degree of coupling at which the Q-factor of the resonator filled up with two specimens-one with a diffusion layer and the other-of homogeneous nature are equal. ©2002 Begell House, Inc.

引用

页码：89 / 94