Fully physical coupled electro-thermal simulations and measurements of power FETs

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[1] Johnson, R.G.
[2] Batty, W.
[3] Panks, A.J.
[4] Snowden, C.M.
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Johnson, R.G. | 2000年 / IEEE, Piscataway, NJ, United States卷 / 01期
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