Thin-layer materials

被引：0

作者：

Weller, M. ^{[1
]}

机构：

[1] MPI, Inst. für Werkstoffwissenschaft, Seestrasse 92, D-70174 Stuttgart, Germany

来源：

关键词：

Constitutive equations - Interconnecting lines - Mechanical spectroscopy - Thin layer materials;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

(Edited Abstract)

引用

页码：549 / 559

共 50 条

[31] THIN-LAYER DIFFRACTION
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[32] THIN-LAYER DRYER
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[34] THIN-LAYER CHROMATOGRAPHY
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