High efficiency silicon solar cells fabricated by catalytic chemical vapor deposition (Cat-CVD) Technology

被引:0
作者
Matsumura, Hideki [1 ]
Koyama, Koichi [1 ]
机构
[1] School of Materials Science, Japan Advanced Institute of Science and Technology, Nomi-shi, Ishikawa 923-1292, Asahidai
关键词
Fabrication - Silicon nitride - Temperature - Silicon solar cells - Chemical vapor deposition - Catalysis;
D O I
10.3131/jvsj2.55.529
中图分类号
学科分类号
摘要
This is to demonstrate recent progress of Cat-CVD technology, particularly for application to high efficiency crystalline silicon (c-Si) solar cells. Surface recombination velocity (SRV) of c-Si, which is one of major factors deciding efficiency of solar cells, can be lowered to 1.5 cm/s or less by coating c-Si surface with Cat-CVD silicon-nitride (SiNx)/amorphous- silicon (a-Si) stacked layers. The value is extremely low compared with ones obtained by other conventional technologies. Phosphorus (P) atoms can be also doped into c-Si at temperatures as low as 80°C with using species generated by catalytic reaction of P-related gases in Cat-CVD apparatus. Degradation of c-Si quality by heating process, which limits the efficiency of c-Si solar cells, can be avoided by this low temperature doping process. All these facts encourage us to use Cat-CVD technology for fabrication of high efficiency c-Si solar cells. © The Vacuum Society of Japan 2012.
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页码:529 / 534
页数:5
相关论文
共 17 条
[1]  
Koyama K., Ohdaira K., Matsumura H., Appl. Phys. Lett., 97, (2010)
[2]  
Hayakawa T., Nakashima Y., Miyamoto M., Koyama K., Ohdaira K., Matsumura H., Jpn. J. Appl. Phys., 50, (2011)
[3]  
Matsumura H., Thin Solid Films, 395, (2001)
[4]  
Hattori R., Nakamura G., Nomura S., Ichise T., Masuda A., Matsumura H., GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest, (1997)
[5]  
Izumi A., Matsumura H., Appl. Phys. Lett., 71, (1997)
[6]  
Izumi A., Thin Solid Films, 395, (2001)
[7]  
Focsa A., Slaoui A., Charifi H., Stoquert J.P., Roques S., Mater. Sci. Eng. B, 159, (2009)
[8]  
Kunst M., Beck G., J. Appl. Phys., 60, (1986)
[9]  
Orton J.W., Blood P., The Electrical Characterization of Semiconductors Measurement of Minority Carrier Properties, (1990)
[10]  
Koyama K., Ohdaira K., Matsumura H., Thin Solid Films, 519, (2011)