Dielectric properties of diamond using an X-band microwave split dielectric resonator

被引：0

作者：

Cuenca, Jerome A. ^{[1
]}

Mandal, Soumen ^{[1
]}

Stritt, Jaspa ^{[1
]}

Zheng, Xiang ^{[2
]}

Pomeroy, James ^{[2
]}

Kuball, Martin ^{[2
]}

Porch, Adrian ^{[3
]}

Williams, Oliver A. ^{[1
]}

机构：

[1] School of Physics and Astronomy, Cardiff University, Cardiff,CF24 3AA, United Kingdom

[2] Center for Device Thermography and Reliability, University of Bristol, Bristol,BS8 1TL, United Kingdom

[3] School of Engineering, Cardiff University, Cardiff,CF24 3AA, United Kingdom

来源：

Carbon | 2024年 / 221卷

基金：

英国工程与自然科学研究理事会; “创新英国”项目; 英国科研创新办公室;

关键词：

Diamonds - Dielectric losses - Dielectric resonators - Grain boundaries - Microwave filters - Microwave resonators - Permittivity;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

This work presents an easy-to-use microwave split dielectric resonator (MSDR) for X-band dielectric measurements of free-standing unpolished poly-crystalline diamond (PCD). PCD grown with varying CH4/H2 and O2/ CH4/H2 in the gas phase show stark differences in dielectric loss. Low microwave dielectric loss PCD is found for CH4/H2 concentrations of less than 5% while PCD grown with O2 show very high loss tangents. Vacuum annealing introduces non-diamond carbon (NDC) impurities which increases the loss, however, even after significant discolouration the loss is still lower than the O2 grown PCD. The loss mechanism of O2 grown PCD is likely due to a high concentration of grain boundaries and grain boundary hopping conduction mechanisms as opposed to high concentrations of NDC impurities. © 2024 The Author(s)

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