Defect imaging technique using guided waves and andtheir their diffuse fields in a plate-like structure

被引：0
|
作者：
Hayashi T. [1 ]
机构：
[1] Department of Mechanical Engineering, Graduate School of Engineering, Osaka University, Yamadaoka, Suita
来源：
Zairyo/Journal of the Society of Materials Science, Japan | 2020年 / 69卷 / 08期
关键词：
Defect imaging; Diffuse field; Guided waves; Plate inspection;
D O I：
10.2472/jsms.69.593
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：593 / 598
页数：5
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