Aging Prediction of Integrated Circuits Using Ring Oscillators and Machine Learning

被引：0
作者：
University of Cincinnati, Dept. of CEAS, Cincinnati [1 ]
OH, United States
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来源：
Proc. IEEE Int. Conf. Phys. Assur. Insp.. Electron., PAINE | 1600年
关键词：
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I：
2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021
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学科分类号：
摘要：
Ageing prediction - Circuit aging - Complex designs - Complex manufacturing - Design-process - Embedded-system - Machine-learning - Manufacturing process - Oscillator frequency - Ring oscillator
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