Aging Prediction of Integrated Circuits Using Ring Oscillators and Machine Learning

被引：0

作者：

University of Cincinnati, Dept. of CEAS, Cincinnati ^{[1
]}

OH, United States

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来源：

Proc. IEEE Int. Conf. Phys. Assur. Insp.. Electron., PAINE | 1600年

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D O I：

2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021

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摘要：

Ageing prediction - Circuit aging - Complex designs - Complex manufacturing - Design-process - Embedded-system - Machine-learning - Manufacturing process - Oscillator frequency - Ring oscillator

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