Fixed Pattern Noise Analysis for Feature Descriptors in CMOS APS Images

被引：0
|
作者：
Zapata-Pérez, Juan [1 ]
Doménech-Asensi, Ginés [1 ]
Ruiz-Merino, Ramón [1 ]
Martínez-Álvarez, Jose Javier [1 ]
Fernández-Berni, Jorge [2 ]
Carmona-Galán, Ricardo [2 ]
机构：
[1] Dpto. de Electrónica y Tecnología de Computadoras, Universidad Politécnica Cartagena, Cartagena, Spain
[2] Instituto de Microelectrónica de Sevilla, IMSE-CNM, CSIC-Universidad de Sevilla, Seville, Spain
来源：
Sensing and Imaging | 2020年 / 21卷 / 01期
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